When asked, many engineers will say that the goal of a test plan for a PCB is full or 100% test coverage. When pressed further, they usually admit that 100% test coverage is virtually impossible to ...
Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback